Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy. [electronic resource]
Producer: 20141006Description: 12-9 p. digitalISSN:- 1879-2723
No physical items for this record
Publication Type: Journal Article; Research Support, Non-U.S. Gov't
There are no comments on this title.
Log in to your account to post a comment.