X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison. [electronic resource]

By: Contributor(s): Publication details: Journal of applied crystallography Oct 2013Description: 1378-1385 p. digitalISSN:
  • 0021-8898
Online resources: In: Journal of applied crystallography vol. 46
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Publication Type: Journal Article

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