APA

Valdrè G., Moro D., . (20121002). 3D finite element analysis of electrostatic deflection and shielding of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: II. Rectangular shaped cantilevers with asymmetric pyramidal tips. : Nanotechnology.

Chicago

Valdrè Giovanni, Moro Daniele, . 20121002. 3D finite element analysis of electrostatic deflection and shielding of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: II. Rectangular shaped cantilevers with asymmetric pyramidal tips. : Nanotechnology.

Harvard

Valdrè G., Moro D., . (20121002). 3D finite element analysis of electrostatic deflection and shielding of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: II. Rectangular shaped cantilevers with asymmetric pyramidal tips. : Nanotechnology.

MLA

Valdrè Giovanni, Moro Daniele, . 3D finite element analysis of electrostatic deflection and shielding of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: II. Rectangular shaped cantilevers with asymmetric pyramidal tips. : Nanotechnology. 20121002.