Mapping titanium and tin oxide phases using EELS: an application of independent component analysis. [electronic resource]

By: Contributor(s): Producer: 20110404Description: 169-76 p. digitalISSN:
  • 1879-2723
Subject(s): Online resources: In: Ultramicroscopy vol. 111
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't

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