APA

Gai P. L., Yoshida K., Shute C., Jia X., Walsh M., Ward M., Dresselhaus M. S., Weertman J. R. & Boyes E. D. (20111021). Probing structures of nanomaterials using advanced electron microscopy methods, including aberration-corrected electron microscopy at the Angstrom scale. : Microscopy research and technique.

Chicago

Gai Pratibha L, Yoshida Kenta, Shute Carla, Jia Xiaoting, Walsh Michael, Ward Michael, Dresselhaus Mildred S, Weertman Julia R and Boyes Edward D. 20111021. Probing structures of nanomaterials using advanced electron microscopy methods, including aberration-corrected electron microscopy at the Angstrom scale. : Microscopy research and technique.

Harvard

Gai P. L., Yoshida K., Shute C., Jia X., Walsh M., Ward M., Dresselhaus M. S., Weertman J. R. and Boyes E. D. (20111021). Probing structures of nanomaterials using advanced electron microscopy methods, including aberration-corrected electron microscopy at the Angstrom scale. : Microscopy research and technique.

MLA

Gai Pratibha L, Yoshida Kenta, Shute Carla, Jia Xiaoting, Walsh Michael, Ward Michael, Dresselhaus Mildred S, Weertman Julia R and Boyes Edward D. Probing structures of nanomaterials using advanced electron microscopy methods, including aberration-corrected electron microscopy at the Angstrom scale. : Microscopy research and technique. 20111021.