APA

De Winter D. A. M., Schneijdenberg C. T. W. M., Lebbink M. N., Lich B., Verkleij A. J., Drury M. R. & Humbel B. M. (20090325). Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging. : Journal of microscopy.

Chicago

De Winter D A Matthijs, Schneijdenberg C T W M, Lebbink M N, Lich B, Verkleij A J, Drury M R and Humbel B M. 20090325. Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging. : Journal of microscopy.

Harvard

De Winter D. A. M., Schneijdenberg C. T. W. M., Lebbink M. N., Lich B., Verkleij A. J., Drury M. R. and Humbel B. M. (20090325). Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging. : Journal of microscopy.

MLA

De Winter D A Matthijs, Schneijdenberg C T W M, Lebbink M N, Lich B, Verkleij A J, Drury M R and Humbel B M. Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging. : Journal of microscopy. 20090325.