Preparation of location-specific thin foils from Fe-3% Si bi- and tri-crystals for examination in a FEG-STEM. [electronic resource]

By: Contributor(s): Producer: 20090317Description: 147-53 p. digitalISSN:
  • 0304-3991
Online resources: In: Ultramicroscopy vol. 109
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't

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