Microchip Problems Plague DOD: Inadequate testing of millions of integrated circuits by Texas Instruments has sown new anxiety about the performance of weapons and spacecraft. [electronic resource]

By: Producer: 20100702Description: 24-6 p. digitalISSN:
  • 0036-8075
Online resources: In: Science (New York, N.Y.) vol. 226
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Publication Type: Journal Article

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