APA

Vilchis R. J. S., Hotta Y. & Yamamoto K. (20070522). Examination of enamel-adhesive interface with focused ion beam and scanning electron microscopy. : American journal of orthodontics and dentofacial orthopedics : official publication of the American Association of Orthodontists, its constituent societies, and the American Board of Orthodontics.

Chicago

Vilchis Rogelio José Scougall, Hotta Yasuaki and Yamamoto Kohji. 20070522. Examination of enamel-adhesive interface with focused ion beam and scanning electron microscopy. : American journal of orthodontics and dentofacial orthopedics : official publication of the American Association of Orthodontists, its constituent societies, and the American Board of Orthodontics.

Harvard

Vilchis R. J. S., Hotta Y. and Yamamoto K. (20070522). Examination of enamel-adhesive interface with focused ion beam and scanning electron microscopy. : American journal of orthodontics and dentofacial orthopedics : official publication of the American Association of Orthodontists, its constituent societies, and the American Board of Orthodontics.

MLA

Vilchis Rogelio José Scougall, Hotta Yasuaki and Yamamoto Kohji. Examination of enamel-adhesive interface with focused ion beam and scanning electron microscopy. : American journal of orthodontics and dentofacial orthopedics : official publication of the American Association of Orthodontists, its constituent societies, and the American Board of Orthodontics. 20070522.