A dynamic numerical model to characterize labile metal complexes collected with diffusion gradient in thin films devices. [electronic resource]
Producer: 20030722Description: 1645-52 p. digitalISSN:- 0013-936X
No physical items for this record
Publication Type: Journal Article; Research Support, Non-U.S. Gov't
There are no comments on this title.
Log in to your account to post a comment.