APA

Barison S., Barreca D., Battiston G. A., Daolio S., Fabrizio M., Gerbasi R. & Tondello E. (20030616). Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO(2-)ZrO(2)-TiO(2) thin films. : Rapid communications in mass spectrometry : RCM.

Chicago

Barison Simona, Barreca Davide, Battiston Giovanni A, Daolio Sergio, Fabrizio Monica, Gerbasi Rosalba and Tondello Eugenio. 20030616. Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO(2-)ZrO(2)-TiO(2) thin films. : Rapid communications in mass spectrometry : RCM.

Harvard

Barison S., Barreca D., Battiston G. A., Daolio S., Fabrizio M., Gerbasi R. and Tondello E. (20030616). Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO(2-)ZrO(2)-TiO(2) thin films. : Rapid communications in mass spectrometry : RCM.

MLA

Barison Simona, Barreca Davide, Battiston Giovanni A, Daolio Sergio, Fabrizio Monica, Gerbasi Rosalba and Tondello Eugenio. Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO(2-)ZrO(2)-TiO(2) thin films. : Rapid communications in mass spectrometry : RCM. 20030616.