Confinement-enhanced electron transport across a metal-semiconductor interface. [electronic resource]

By: Contributor(s): Producer: 20010913Description: 056801 p. digitalISSN:
  • 0031-9007
Online resources: In: Physical review letters vol. 87
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

Publication Type: Journal Article

There are no comments on this title.

to post a comment.