Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. (Record no. 30660825)

MARC details
000 -LEADER
fixed length control field 00783 a2200205 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250518085438.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field ####s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 2072-666X
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.3390/mi11020211
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name De Teresa, José María
245 00 - TITLE STATEMENT
Title Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Micromachines
Date of publication, distribution, etc. Feb 2020
500 ## - GENERAL NOTE
General note Publication Type: Published Erratum
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Orús, Pablo
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Córdoba, Rosa
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Philipp, Patrick
773 0# - HOST ITEM ENTRY
Title Micromachines
Related parts vol. 11
-- no. 2
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.3390/mi11020211">https://doi.org/10.3390/mi11020211</a>
Public note Available from publisher's website

No items available.