A conducting atomic force microscopy study of conducting filament nanobits in the epitaxial NiO thin film prepared precisely controlled by the oxidation time of the single crystalline Ni substrates. (Record no. 29834956)

MARC details
000 -LEADER
fixed length control field 00827 a2200193 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250518045039.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field ####s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 1879-2723
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1016/j.ultramic.2019.05.009
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Shin, Hyun Wook
245 00 - TITLE STATEMENT
Title A conducting atomic force microscopy study of conducting filament nanobits in the epitaxial NiO thin film prepared precisely controlled by the oxidation time of the single crystalline Ni substrates.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Ultramicroscopy
Date of publication, distribution, etc. Oct 2019
300 ## - PHYSICAL DESCRIPTION
Extent 57-61 p.
Other physical details digital
500 ## - GENERAL NOTE
General note Publication Type: Journal Article
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Son, Jong Yeog
773 0# - HOST ITEM ENTRY
Title Ultramicroscopy
Related parts vol. 205
-- p. 57-61
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1016/j.ultramic.2019.05.009">https://doi.org/10.1016/j.ultramic.2019.05.009</a>
Public note Available from publisher's website

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