Effect of the fixed charge distribution on the mobility degradation of the high-k dielectric MOSFETs. (Record no. 24885424)

MARC details
000 -LEADER
fixed length control field 00727 a2200193 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250517032053.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 201505s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 1533-4899
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Woo, Myung Hun
264 #0 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice 20150529
245 00 - TITLE STATEMENT
Title Effect of the fixed charge distribution on the mobility degradation of the high-k dielectric MOSFETs.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Journal of nanoscience and nanotechnology
Date of publication, distribution, etc. Nov 2014
300 ## - PHYSICAL DESCRIPTION
Extent 8211-4 p.
Other physical details digital
500 ## - GENERAL NOTE
General note Publication Type: Journal Article; Research Support, Non-U.S. Gov't
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Ryu, Ju Tae
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Kim, Tae Whan
773 0# - HOST ITEM ENTRY
Title Journal of nanoscience and nanotechnology
Related parts vol. 14
-- no. 11
-- p. 8211-4

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