Probing stochastic nano-scale inelastic events in stressed amorphous metal. (Record no. 24294291)

MARC details
000 -LEADER
fixed length control field 00849 a2200265 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250517000659.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 201505s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 2045-2322
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1038/srep06699
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Yang, Y
264 #0 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice 20150512
245 00 - TITLE STATEMENT
Title Probing stochastic nano-scale inelastic events in stressed amorphous metal.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Scientific reports
Date of publication, distribution, etc. Oct 2014
300 ## - PHYSICAL DESCRIPTION
Extent 6699 p.
Other physical details digital
500 ## - GENERAL NOTE
General note Publication Type: Journal Article; Research Support, Non-U.S. Gov't
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Fu, X L
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Wang, S
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Liu, Z Y
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Ye, Y F
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Sun, B A
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Liu, C T
773 0# - HOST ITEM ENTRY
Title Scientific reports
Related parts vol. 4
-- p. 6699
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1038/srep06699">https://doi.org/10.1038/srep06699</a>
Public note Available from publisher's website

No items available.