Nanoscale crystallization of phase change Ge2Sb2Te5 film with AFM lithography. (Record no. 20183684)

MARC details
000 -LEADER
fixed length control field 00690 a2200193 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250516002810.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 201103s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 1932-8745
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1002/sca.20201
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Kim, JunHo
264 #0 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice 20110310
245 00 - TITLE STATEMENT
Title Nanoscale crystallization of phase change Ge2Sb2Te5 film with AFM lithography.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Scanning
Date of publication, distribution, etc.
300 ## - PHYSICAL DESCRIPTION
Extent 320-6 p.
Other physical details digital
500 ## - GENERAL NOTE
General note Publication Type: Journal Article; Research Support, Non-U.S. Gov't
773 0# - HOST ITEM ENTRY
Title Scanning
Related parts vol. 32
-- no. 5
-- p. 320-6
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1002/sca.20201">https://doi.org/10.1002/sca.20201</a>
Public note Available from publisher's website

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