Characterization of sediment reference materials by x-ray photoelectron spectroscopy. (Record no. 18425901)

MARC details
000 -LEADER
fixed length control field 00743 a2200217 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250515144516.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 201210s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 0039-9140
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1016/0039-9140(85)80056-4
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Soma, M
264 #0 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice 20121002
245 00 - TITLE STATEMENT
Title Characterization of sediment reference materials by x-ray photoelectron spectroscopy.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Talanta
Date of publication, distribution, etc. Mar 1985
300 ## - PHYSICAL DESCRIPTION
Extent 177-81 p.
Other physical details digital
500 ## - GENERAL NOTE
General note Publication Type: Journal Article
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Seyama, H
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Okamoto, K
773 0# - HOST ITEM ENTRY
Title Talanta
Related parts vol. 32
-- no. 3
-- p. 177-81
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1016/0039-9140(85)80056-4">https://doi.org/10.1016/0039-9140(85)80056-4</a>
Public note Available from publisher's website

No items available.