Microanalysis (micro-XRF, micro-XANES, and micro-XRD) of a tertiary sediment using microfocused synchrotron radiation. (Record no. 17036044)
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000 -LEADER | |
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fixed length control field | 01158 a2200253 4500 |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20250515065742.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 200708s 0 0 eng d |
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER | |
International Standard Serial Number | 1431-9276 |
024 7# - OTHER STANDARD IDENTIFIER | |
Standard number or code | 10.1017/S1431927607070316 |
Source of number or code | doi |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | NLM |
Language of cataloging | eng |
Transcribing agency | NLM |
100 1# - MAIN ENTRY--PERSONAL NAME | |
Personal name | Denecke, Melissa A |
264 #0 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
Date of production, publication, distribution, manufacture, or copyright notice | 20070806 |
245 00 - TITLE STATEMENT | |
Title | Microanalysis (micro-XRF, micro-XANES, and micro-XRD) of a tertiary sediment using microfocused synchrotron radiation. |
Medium | [electronic resource] |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Name of publisher, distributor, etc. | Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada |
Date of publication, distribution, etc. | Jun 2007 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 165-72 p. |
Other physical details | digital |
500 ## - GENERAL NOTE | |
General note | Publication Type: Journal Article |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Somogyi, Andrea |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Janssens, Koen |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Simon, Rolf |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Dardenne, Kathy |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Noseck, Ulrich |
773 0# - HOST ITEM ENTRY | |
Title | Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada |
Related parts | vol. 13 |
-- | no. 3 |
-- | p. 165-72 |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | <a href="https://doi.org/10.1017/S1431927607070316">https://doi.org/10.1017/S1431927607070316</a> |
Public note | Available from publisher's website |
No items available.