Determination of mean free path for energy loss and surface oxide film thickness using convergent beam electron diffraction and thickness mapping: a case study using Si and P91 steel. (Record no. 16770302)

MARC details
000 -LEADER
fixed length control field 00836 a2200193 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250515052737.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 200702s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 0022-2720
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1111/j.1365-2818.2006.01690.x
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Mitchell, D R G
264 #0 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice 20070206
245 00 - TITLE STATEMENT
Title Determination of mean free path for energy loss and surface oxide film thickness using convergent beam electron diffraction and thickness mapping: a case study using Si and P91 steel.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Journal of microscopy
Date of publication, distribution, etc. Nov 2006
300 ## - PHYSICAL DESCRIPTION
Extent 187-96 p.
Other physical details digital
500 ## - GENERAL NOTE
General note Publication Type: Journal Article
773 0# - HOST ITEM ENTRY
Title Journal of microscopy
Related parts vol. 224
-- no. Pt 2
-- p. 187-96
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1111/j.1365-2818.2006.01690.x">https://doi.org/10.1111/j.1365-2818.2006.01690.x</a>
Public note Available from publisher's website

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