Highest-accuracy interferometer alignment by retroreflection scanning. (Record no. 15227340)

MARC details
000 -LEADER
fixed length control field 00717 a2200205 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250514210728.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 200502s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 1559-128X
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1364/ao.43.005738
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Schödel, René
264 #0 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice 20050201
245 00 - TITLE STATEMENT
Title Highest-accuracy interferometer alignment by retroreflection scanning.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Applied optics
Date of publication, distribution, etc. Nov 2004
300 ## - PHYSICAL DESCRIPTION
Extent 5738-43 p.
Other physical details digital
500 ## - GENERAL NOTE
General note Publication Type: Journal Article
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Bönsch, Gerhard
773 0# - HOST ITEM ENTRY
Title Applied optics
Related parts vol. 43
-- no. 31
-- p. 5738-43
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1364/ao.43.005738">https://doi.org/10.1364/ao.43.005738</a>
Public note Available from publisher's website

No items available.