XAFS and X-ray reflectivity study of III-V compound native oxide/GaAs interfaces. (Record no. 11437595)

MARC details
000 -LEADER
fixed length control field 00845 a2200241 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250514005525.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 200109s 0 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 0909-0495
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1107/s0909049501001248
Source of number or code doi
040 ## - CATALOGING SOURCE
Original cataloging agency NLM
Language of cataloging eng
Transcribing agency NLM
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Cheong, S K
264 #0 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice 20010906
245 00 - TITLE STATEMENT
Title XAFS and X-ray reflectivity study of III-V compound native oxide/GaAs interfaces.
Medium [electronic resource]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Journal of synchrotron radiation
Date of publication, distribution, etc. Mar 2001
300 ## - PHYSICAL DESCRIPTION
Extent 824-6 p.
Other physical details digital
500 ## - GENERAL NOTE
General note Publication Type: Journal Article
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Bunker, B A
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Hall, D C
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Snider, G L
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Barrios, P J
773 0# - HOST ITEM ENTRY
Title Journal of synchrotron radiation
Related parts vol. 8
-- no. Pt 2
-- p. 824-6
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1107/s0909049501001248">https://doi.org/10.1107/s0909049501001248</a>
Public note Available from publisher's website

No items available.