APA

Richter K., Haking A., Troester H., Spiess E., Spring H., Probst W., Schultz P., Witz J. & Trendelenburg M. (19980428). Use of a mass-thickness marker to estimate systematic errors and statistical noise in the detection of phosphorus by electron spectroscopic imaging. : Micron (Oxford, England : 1993).

Chicago

Richter K, Haking A, Troester H, Spiess E, Spring H, Probst W, Schultz P, Witz J and Trendelenburg M. 19980428. Use of a mass-thickness marker to estimate systematic errors and statistical noise in the detection of phosphorus by electron spectroscopic imaging. : Micron (Oxford, England : 1993).

Harvard

Richter K., Haking A., Troester H., Spiess E., Spring H., Probst W., Schultz P., Witz J. and Trendelenburg M. (19980428). Use of a mass-thickness marker to estimate systematic errors and statistical noise in the detection of phosphorus by electron spectroscopic imaging. : Micron (Oxford, England : 1993).

MLA

Richter K, Haking A, Troester H, Spiess E, Spring H, Probst W, Schultz P, Witz J and Trendelenburg M. Use of a mass-thickness marker to estimate systematic errors and statistical noise in the detection of phosphorus by electron spectroscopic imaging. : Micron (Oxford, England : 1993). 19980428.