A new software package for interpreting electron diffraction contrast images of arbitrary displacement fields: SIMCON.

Janssens, K G

A new software package for interpreting electron diffraction contrast images of arbitrary displacement fields: SIMCON. [electronic resource] - Microscopy research and technique Jun 1993 - 171-2 p. digital

Publication Type: Journal Article

1059-910X

10.1002/jemt.1070250209 doi


Electron Probe Microanalysis
Image Interpretation, Computer-Assisted
Silicon--chemistry
Software