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EBIC study of electron generation function in a-Si:H.

Najar, S

EBIC study of electron generation function in a-Si:H. [electronic resource] - Microscopy research and technique Aug 1994 - 527-34 p. digital

Publication Type: Journal Article

ISSN: 1059-910X

Standard No.: 10.1002/jemt.1070280608 doi

Subjects--Topical Terms:
Electrons
Microscopy, Electron--methods
Silicon Compounds--chemistry

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