Variable-Wavelength Quick Scanning Nanofocused X-Ray Microscopy for In Situ Strain and Tilt Mapping.

Richard, Marie-Ingrid

Variable-Wavelength Quick Scanning Nanofocused X-Ray Microscopy for In Situ Strain and Tilt Mapping. [electronic resource] - Small (Weinheim an der Bergstrasse, Germany) Feb 2020 - e1905990 p. digital

Publication Type: Journal Article

1613-6829

10.1002/smll.201905990 doi