Variable-Wavelength Quick Scanning Nanofocused X-Ray Microscopy for In Situ Strain and Tilt Mapping.
Richard, Marie-Ingrid
Variable-Wavelength Quick Scanning Nanofocused X-Ray Microscopy for In Situ Strain and Tilt Mapping. [electronic resource] - Small (Weinheim an der Bergstrasse, Germany) Feb 2020 - e1905990 p. digital
Publication Type: Journal Article
1613-6829
10.1002/smll.201905990 doi
Variable-Wavelength Quick Scanning Nanofocused X-Ray Microscopy for In Situ Strain and Tilt Mapping. [electronic resource] - Small (Weinheim an der Bergstrasse, Germany) Feb 2020 - e1905990 p. digital
Publication Type: Journal Article
1613-6829
10.1002/smll.201905990 doi