A novel method and system for calibrating the spring constant of atomic force microscope cantilever based on electromagnetic actuation.

Tian, Yanling

A novel method and system for calibrating the spring constant of atomic force microscope cantilever based on electromagnetic actuation. [electronic resource] - The Review of scientific instruments Dec 2018 - 125119 p. digital

Publication Type: Journal Article

1089-7623

10.1063/1.5051401 doi