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Nanoparticle classification in wide-field interferometric microscopy by supervised learning from model.

Avci, Oguzhan

Nanoparticle classification in wide-field interferometric microscopy by supervised learning from model. [electronic resource] - Applied optics May 2017 - 4238-4242 p. digital

Publication Type: Journal Article

ISSN: 1539-4522

Standard No.: 10.1364/AO.56.004238 doi

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