Comparison of cross-sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers.

Norris, D J

Comparison of cross-sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers. [electronic resource] - Journal of microscopy 12 2017 - 288-297 p. digital

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

1365-2818

10.1111/jmi.12654 doi