APA

Vieira E. M. F., Toudert J., Rolo A. G., Parisini A., Leitão J. P., Correia M. R., Franco N., Alves E., Chahboun A., Martín-Sánchez J., Serna R. & Gomes M. J. M. (20180723). SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO. : Nanotechnology.

Chicago

Vieira E M F, Toudert J, Rolo A G, Parisini A, Leitão J P, Correia M R, Franco N, Alves E, Chahboun A, Martín-Sánchez J, Serna R and Gomes M J M. 20180723. SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO. : Nanotechnology.

Harvard

Vieira E. M. F., Toudert J., Rolo A. G., Parisini A., Leitão J. P., Correia M. R., Franco N., Alves E., Chahboun A., Martín-Sánchez J., Serna R. and Gomes M. J. M. (20180723). SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO. : Nanotechnology.

MLA

Vieira E M F, Toudert J, Rolo A G, Parisini A, Leitão J P, Correia M R, Franco N, Alves E, Chahboun A, Martín-Sánchez J, Serna R and Gomes M J M. SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO. : Nanotechnology. 20180723.