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Structural Properties Characterized by the Film Thickness and Annealing Temperature for La

Wang, Xing

Structural Properties Characterized by the Film Thickness and Annealing Temperature for La [electronic resource] - Nanoscale research letters Dec 2017 - 233 p. digital

Publication Type: Journal Article

ISSN: 1931-7573

Standard No.: 10.1186/s11671-017-2018-8 doi

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