APA

Shida K., Takeuchi S., Imai Y., Kimura S., Schulze A., Caymax M. & Sakai A. (20180725). Tomographic Mapping Analysis in the Depth Direction of High-Ge-Content SiGe Layers with Compositionally Graded Buffers Using Nanobeam X-ray Diffraction. : ACS applied materials & interfaces.

Chicago

Shida Kazuki, Takeuchi Shotaro, Imai Yasuhiko, Kimura Shigeru, Schulze Andreas, Caymax Matty and Sakai Akira. 20180725. Tomographic Mapping Analysis in the Depth Direction of High-Ge-Content SiGe Layers with Compositionally Graded Buffers Using Nanobeam X-ray Diffraction. : ACS applied materials & interfaces.

Harvard

Shida K., Takeuchi S., Imai Y., Kimura S., Schulze A., Caymax M. and Sakai A. (20180725). Tomographic Mapping Analysis in the Depth Direction of High-Ge-Content SiGe Layers with Compositionally Graded Buffers Using Nanobeam X-ray Diffraction. : ACS applied materials & interfaces.

MLA

Shida Kazuki, Takeuchi Shotaro, Imai Yasuhiko, Kimura Shigeru, Schulze Andreas, Caymax Matty and Sakai Akira. Tomographic Mapping Analysis in the Depth Direction of High-Ge-Content SiGe Layers with Compositionally Graded Buffers Using Nanobeam X-ray Diffraction. : ACS applied materials & interfaces. 20180725.