Carbon contamination in scanning transmission electron microscopy and its impact on phase-plate applications.
Hettler, Simon
Carbon contamination in scanning transmission electron microscopy and its impact on phase-plate applications. [electronic resource] - Micron (Oxford, England : 1993) May 2017 - 38-47 p. digital
Publication Type: Journal Article
1878-4291
10.1016/j.micron.2017.02.002 doi
Carbon contamination in scanning transmission electron microscopy and its impact on phase-plate applications. [electronic resource] - Micron (Oxford, England : 1993) May 2017 - 38-47 p. digital
Publication Type: Journal Article
1878-4291
10.1016/j.micron.2017.02.002 doi