Comparison of the Thermal Degradation of Heavily Nb-Doped and Normal PZT Thin Films.

Yang, Jeong-Suong

Comparison of the Thermal Degradation of Heavily Nb-Doped and Normal PZT Thin Films. [electronic resource] - IEEE transactions on ultrasonics, ferroelectrics, and frequency control 03 2017 - 617-622 p. digital

Publication Type: Journal Article

1525-8955

10.1109/TUFFC.2017.2647971 doi