The Performance Improvement of N2 Plasma Treatment on ZrO2 Gate Dielectric Thin-Film Transistors with Atmospheric Pressure Plasma-Enhanced Chemical Vapor Deposition IGZO Channel.

Wu, Chien-Hung

The Performance Improvement of N2 Plasma Treatment on ZrO2 Gate Dielectric Thin-Film Transistors with Atmospheric Pressure Plasma-Enhanced Chemical Vapor Deposition IGZO Channel. [electronic resource] - Journal of nanoscience and nanotechnology Jun 2016 - 6044-8 p. digital

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

1533-4899

10.1166/jnn.2016.12612 doi