Characterizing nanoscale scanning probes using electron microscopy: A novel fixture and a practical guide.
Jacobs, Tevis D B
Characterizing nanoscale scanning probes using electron microscopy: A novel fixture and a practical guide. [electronic resource] - The Review of scientific instruments Jan 2016 - 013703 p. digital
Publication Type: Journal Article
1089-7623
10.1063/1.4937810 doi
Characterizing nanoscale scanning probes using electron microscopy: A novel fixture and a practical guide. [electronic resource] - The Review of scientific instruments Jan 2016 - 013703 p. digital
Publication Type: Journal Article
1089-7623
10.1063/1.4937810 doi