Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution.
Kozina, M
Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution. [electronic resource] - Structural dynamics (Melville, N.Y.) May 2014 - 034301 p. digital
Publication Type: Journal Article
2329-7778
10.1063/1.4875347 doi
Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution. [electronic resource] - Structural dynamics (Melville, N.Y.) May 2014 - 034301 p. digital
Publication Type: Journal Article
2329-7778
10.1063/1.4875347 doi