Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution.

Kozina, M

Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution. [electronic resource] - Structural dynamics (Melville, N.Y.) May 2014 - 034301 p. digital

Publication Type: Journal Article

2329-7778

10.1063/1.4875347 doi