APA

Fitzek H., Schroettner H., Wagner J., Hofer F. & Rattenberger J. (20161216). High-quality imaging in environmental scanning electron microscopy--optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM. : Journal of microscopy.

Chicago

Fitzek H, Schroettner H, Wagner J, Hofer F and Rattenberger J. 20161216. High-quality imaging in environmental scanning electron microscopy--optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM. : Journal of microscopy.

Harvard

Fitzek H., Schroettner H., Wagner J., Hofer F. and Rattenberger J. (20161216). High-quality imaging in environmental scanning electron microscopy--optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM. : Journal of microscopy.

MLA

Fitzek H, Schroettner H, Wagner J, Hofer F and Rattenberger J. High-quality imaging in environmental scanning electron microscopy--optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM. : Journal of microscopy. 20161216.