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Wavefront measurement made by an off-the-shelf laser-scanning pico projector.

Chen, Jia-Wei

Wavefront measurement made by an off-the-shelf laser-scanning pico projector. [electronic resource] - Applied optics Oct 2015 - E235-40 p. digital

Publication Type: Journal Article

ISSN: 1539-4522

Standard No.: 10.1364/AO.54.00E235 doi

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