Structural defect-dependent resistive switching in Cu-O/Si studied by Kelvin probe force microscopy and conductive atomic force microscopy.
Kumar, Mohit
Structural defect-dependent resistive switching in Cu-O/Si studied by Kelvin probe force microscopy and conductive atomic force microscopy. [electronic resource] - Nanotechnology Aug 2015 - 345702 p. digital
Publication Type: Journal Article
1361-6528
10.1088/0957-4484/26/34/345702 doi
Structural defect-dependent resistive switching in Cu-O/Si studied by Kelvin probe force microscopy and conductive atomic force microscopy. [electronic resource] - Nanotechnology Aug 2015 - 345702 p. digital
Publication Type: Journal Article
1361-6528
10.1088/0957-4484/26/34/345702 doi