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Laue-DIC: a new method for improved stress field measurements at the micrometer scale.

Petit, J

Laue-DIC: a new method for improved stress field measurements at the micrometer scale. [electronic resource] - Journal of synchrotron radiation Jul 2015 - 980-94 p. digital

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

ISSN: 1600-5775

Standard No.: 10.1107/S1600577515005780 doi

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