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Further investigation on the phase stitching and system errors in digital holography.

Wen, Yongfu

Further investigation on the phase stitching and system errors in digital holography. [electronic resource] - Applied optics Jan 2015 - 266-76 p. digital

Publication Type: Journal Article

ISSN: 1539-4522

Standard No.: 10.1364/AO.54.000266 doi

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