Mobility degradation mechanisms of MOSFETs with a high-k dielectric layer.
Jung, Hyun Soo
Mobility degradation mechanisms of MOSFETs with a high-k dielectric layer. [electronic resource] - Journal of nanoscience and nanotechnology Nov 2014 - 8215-8 p. digital
Publication Type: Journal Article; Research Support, Non-U.S. Gov't
1533-4899
10.1166/jnn.2014.9896 doi
Mobility degradation mechanisms of MOSFETs with a high-k dielectric layer. [electronic resource] - Journal of nanoscience and nanotechnology Nov 2014 - 8215-8 p. digital
Publication Type: Journal Article; Research Support, Non-U.S. Gov't
1533-4899
10.1166/jnn.2014.9896 doi