In situ TEM characterization of shear-stress-induced interlayer sliding in the cross section view of molybdenum disulfide.

Oviedo, Juan Pablo

In situ TEM characterization of shear-stress-induced interlayer sliding in the cross section view of molybdenum disulfide. [electronic resource] - ACS nano Feb 2015 - 1543-51 p. digital

Publication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.

1936-086X

10.1021/nn506052d doi