Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading.

Lambert, P K

Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading. [electronic resource] - The Review of scientific instruments Sep 2014 - 093901 p. digital

Publication Type: Journal Article; Research Support, N.I.H., Extramural; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.

1089-7623

10.1063/1.4893881 doi


Elasticity
Lasers, Semiconductor
Materials Testing--instrumentation
Pressure
Stress, Mechanical
Time Factors
Weight-Bearing
X-Ray Diffraction--instrumentation