Probing and analyzing buried interfaces of multifunctional oxides using a secondary electron energy analyzer.

Srinivasan, Avinash

Probing and analyzing buried interfaces of multifunctional oxides using a secondary electron energy analyzer. [electronic resource] - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Oct 2014 - 1494-8 p. digital

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

1435-8115

10.1017/S1431927614012781 doi