Enhanced data generated with electrons (EDGE) special issue introduction.
Stéphan, Odile
Enhanced data generated with electrons (EDGE) special issue introduction. [electronic resource] - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Jun 2014 - 647-8 p. digital
Publication Type: Introductory Journal Article
1435-8115
10.1017/S1431927614000920 doi
Enhanced data generated with electrons (EDGE) special issue introduction. [electronic resource] - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Jun 2014 - 647-8 p. digital
Publication Type: Introductory Journal Article
1435-8115
10.1017/S1431927614000920 doi