Dynamic electrostatic force microscopy technique for the study of electrical properties with improved spatial resolution.

Maragliano, C

Dynamic electrostatic force microscopy technique for the study of electrical properties with improved spatial resolution. [electronic resource] - Nanotechnology Jun 2013 - 225703 p. digital

Publication Type: Journal Article

1361-6528

10.1088/0957-4484/24/22/225703 doi