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Following strain-induced mosaicity changes of ferroelectric thin films by ultrafast reciprocal space mapping.

Schick, D

Following strain-induced mosaicity changes of ferroelectric thin films by ultrafast reciprocal space mapping. [electronic resource] - Physical review letters Mar 2013 - 095502 p. digital

Publication Type: Journal Article

ISSN: 1079-7114

Standard No.: 10.1103/PhysRevLett.110.095502 doi

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