Enhanced localized energetic-ion losses resulting from single-pass interactions with Alfvén eigenmodes.

Chen, X

Enhanced localized energetic-ion losses resulting from single-pass interactions with Alfvén eigenmodes. [electronic resource] - Physical review letters Feb 2013 - 065004 p. digital

Publication Type: Journal Article

ISSN: 1079-7114

Standard No.: 10.1103/PhysRevLett.110.065004 doi

Enhanced localized energetic-ion losses resulting from single-pass interactions with Alfvén eigenmodes.

APA

Chen X., Austin M. E., Fisher R. K., Heidbrink W. W., Kramer G. J., Nazikian R., Pace D. C., Petty C. C. & Van Zeeland M. A. (20130408). Enhanced localized energetic-ion losses resulting from single-pass interactions with Alfvén eigenmodes. : Physical review letters.

Chicago

Chen X, Austin M E, Fisher R K, Heidbrink W W, Kramer G J, Nazikian R, Pace D C, Petty C C and Van Zeeland M A. 20130408. Enhanced localized energetic-ion losses resulting from single-pass interactions with Alfvén eigenmodes. : Physical review letters.

Harvard

Chen X., Austin M. E., Fisher R. K., Heidbrink W. W., Kramer G. J., Nazikian R., Pace D. C., Petty C. C. and Van Zeeland M. A. (20130408). Enhanced localized energetic-ion losses resulting from single-pass interactions with Alfvén eigenmodes. : Physical review letters.

MLA

Chen X, Austin M E, Fisher R K, Heidbrink W W, Kramer G J, Nazikian R, Pace D C, Petty C C and Van Zeeland M A. Enhanced localized energetic-ion losses resulting from single-pass interactions with Alfvén eigenmodes. : Physical review letters. 20130408.

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